Facilities
 Horiba Dynamic Light Scattering Analyzer |
Dynamic Light Scattering Analyzer Liddell Lab Duffield 327 Contact Erin Riley |
 Malvern Zetasizer Nano-ZS |
Malvern Zetasizer Nano-ZS NBTC Duffield 201 Contact Teresa Poori Enables measurement of particle size, zeta potential and molecular weight at fixed or variable temperature using Dynamic Light Scattering (DLS). |
 Imaging Ellipsometer - Nanofilm EP3 |
Imaging Ellipsometer - Nanofilm EP3 NBTC Duffield 201 Contact Teresa Porri Thin films of adsorbed or deposited material (thin metal films, oxides, organic coatings, self-adsorbed monolayers, etc.) can be measured using imaging ellipsometry. |
 FEI Tecnai T12 Spirit Twin TEM/STEM |
Imaging TEM (Tecnai T12) CCMR Duffield 150 Contact John Grazul 120 kV field emission Tunneling Electron Microscope (TEM) capable of doing electron tomography and diffraction analysis. |
 KECK FE–SEM, LEO 1550 (Schottky Field Emitter) |
KECK FE–SEM CCMR Clark F3 Contact Mick Thomas High resolution (1 nm at 20 Kev and 2.5 nm at 5 Kev) of specimens using Field Emmision Scanning Electron Microscope (FE–SEM) |
 Scintag Theta-theta diffractometer (for XRD), Scintag, Inc. |
Scintag Theta-theta diffractometer CCMR 1102 Snee Hall Contact Maura Weathers For x-ray diffraction of polycrystalline thin films and powders. |
 Olympus BX-51 Optical |
Olypmpus Optical CCMR Bard Sub-basement Contact John Hunt Optical microscope with cross-polarized transmitted light, digital camera and magnification from 7x to 500x. |
 Confocal Raman Microscope |
Confocal Raman Microscope CCMR Bard SB-30 Contact Kit Umbach Using either 488 nm or 785 nm excitation wavelengths, reflection Raman microscopy allows chemical identification of elements and compounds. A spatial resolution of ~1 micron is possible. |
 Woollam Variable Angle Spectroscopic Ellipsometer |
Woollam Variable Angle Spectroscopic Ellipsometer CNF Duffield Contact Rob Ilic Thickness and optical properties of thin films can be determined using this Variable angle ellipsometer (20-90 degree angle range.) |
 CVC 4500 Evaporator |
CVC 4500 Evaporator CNF Duffield Contact Rob Ilic This cryopumped evaporator contains a 4 pocket electron gun source and 3 thermal evaporation sources. |
 Zeiss Ultra 55 SEM |
Zeiss Ultra SEM CNF Duffield Contact Daron Westly Nanoscale resolution of structures is possible using a Scanning Electron Microscope. Operates at beam energies from 100 V to 30 kV. |
 FEI 611 Focused Ion Beam System |
Focused Ion Beam System CNF Duffield Contact Jerry Drumheller This Focused Ion Beam (FIB) uses a high brightness Ga liquid metal ion source coupled with a double lens focusing system to produce an intense beam of ions capable of being focused to a 40 nm diameter spot. It is capable of milling a variety of metals, semiconductors and insulators and depositing SiOx and Pt. |
 YES CV200RFS Oxygen Plasma Asher |
YES CV200RFS Oxygen Plasma Asher CNF Duffield Contact Jerry Drumheller Vacuum system with Oxygen Plasma used for removing organics and photoresist. Nitrogen and Argon are also available for gentle cleaning and oxide removal. Typical operating pressure is 300–350 mTorr. |
 Zeiss LSM Live Confocal Microscope |
Zeiss LSM Live Confocal Microscope Cohen Lab Clark C7 Contact Mark Buckley Inverted confocal microscope available with 100x and 63x oil objectives and 532 nm excitation source. |
 Leica TCS SP2 Confocal Microscope |
Leica Spectral Confocal Microscope NBTC Biotech 160a Contact Carol Bayles The Leica TCS SP2 system is equipped with three lasers: a 4–line argon (458, 475, 488, 514 nm); a green HeNe (543 nm); and a red HeNe (633 nm). Four fluorescence detectors and one transmitted detector allow simultaneous capture of 4 colors plus brightfield. Instead of emission filters a prism and series of slits is used, allowing the user to select and adjust emission wavelengths while viewing. The upright microscope is equipped with high NA oil and water immersion objectives, DIC optics and a motorized stage for Z-series acquisition. |
 General Area Detector Diffraction System (GADDS), Bruker-Axs |
General Area Detector Diffraction System (GADDS), Bruker-Axs CCMR 1158 Snee Hall Contact Maura Weathers Standard powder analysis and texture analysis in transmission or reflection are possible using GADDS. |
 FTIR - Vertex 80v |
FTIR - Vertex 80v NBTC Duffield 201 Contact Teresa Porri The NBTC has an advanced research FT–IR system, equiped with a mid–IR source and a nitrogen cooled MCT detector, allowing high sensitivity spectra to be aquired between ~ 450–7000cm–1. An diamond ATR crystal accessory for all kind of bulk samples is available as well as a variable grazing angle accessory with polarizer for characterization of thin films on reflective surfaces The NBTC FT–IR is a Vertex80v, which is Bruker Optics most recent model. It has vacuum evacuated optics and an option to have a vacuum evacuated or nitrogen purged sample compartment in order to minimize backgrund adsorption from CO2 and H2O. |
 Thermo Scientific IEC Centra-CL3R Centrifuge |
Centra-CL3R Liddell Lab Bard 344 Contact Esther Fung The CL3 series will store and lock up to 99 protocols and has speed and accuracies to the nearest 50 rpm, select temperatures with 1°C increments, as well as automatic speed calculation of the g-force. Laboratory technicians can be confident that the CL3 series will provide you a quality performance with accurate results. Capable of reaching 4°C from 20°C in ~7 minutes with rapid condition means you always spin at the required temperature. The CL3 series accommodates up to 1 liter of sample (4 x 250 mL) accepting a wide variety of popular tubes including 15 mL, 50 mL, 225 mL conical, Vacutainer® tubes to 15 mL (16 x 125 mm), microtubes, microplates (standard and deepwell), microscope slides, and an assortment of filtration devices. |